Synchrotron based X-ray fluorescence for trace elemental analysis of industrial sludge

Journal of Environmental Treatment Techniques

2021, Volume 9, Issue 1, Pages: 192-195

J. Environ. Treat. Tech.

ISSN: 2309-1185

Journal web link: http://www.jett.dormaj.com

https://doi.org/10.47277/JETT/9(1)195

Synchrotron based X-ray fluorescence for trace

elemental analysis of industrial sludge

1

2

1

Vijay Kumar Garg , Arun Lal Srivastav , Manoj Kumar Tiwari , Ajay Sharma * and

Varinder Singh Kanwar¹

1

Chitkara University School of Engineering and Technology, Chitkara University, Himachal Pradesh-174103, India

2

BL-16, Indus-2, Raja Ramana Centre for Advanced Technology, Indore, India

Received: 12/08/2020

Accepted: 01/11/2020

Published: 20/03/2021

Abstract

This research article presents the application of the synchrotron-based X-ray fluorescence (XRF) technique for the resolution of trace

elemental accumulation in industrial sludge/waste. The X-ray fluorescence using synchrotron radiation presents an expeditious

exposition of a wide scale of elements (Sodium to Uranium) together with an ingenuous sample preparation procedure. The present X-

ray fluorescence studies carried out for the paper and toothpaste industry sludge at synchrotron source (Beam Line -16), Indus-2, Raja

Ramanna Centre for Advanced Technology, Indore, India. The XRF results show very low traces of heavy metals present in paper and

toothpaste industry sludge and therefore recommend for safe and efficient reuse.

Keywords: Elemental analysis; synchrotron radiation; industrial sludge and X-ray fluorescence

1

sample is atomized because of the primary incident X-ray or

1

Introduction

gamma ray photons. The energy and intensity of the

characteristic X-rays in the XRF spectra indicate the element

present and its concentration in the sample. XRF is an

important technique of elemental analysis for distinct kind of

samples and it is an extremely responsive technique, which

follows the principle of interaction of atoms with radiation [4-

In developing countries, industrial sectors pose significant

environmental and occupational health risks to its populations.

As industries are booming and large quantities of industrial

waste and are being dumped illegally either in open or in the

nearby riverbeds. World’s urban societies are increasing

rapidly than the global population, especially in the developing

countries. Urban growth has created momentous alteration to

the ecological system by increasing waste accumulation

through human activities. The techniques which are capable to

detect the level of metallic elements to ppb limits in a variety

of environmental, biological as well as geological samples are;

6]. The principal asset of the X-ray fluorescence method over

other elemental analysis techniques is its non-destructiveness,

simultaneous multi-elemental capability, ingenuous sample

preparation and high resolution for trace elements. Daly et al.

[7] used EDXRF for elemental analysis dairy processing sludge

before its application in the agricultural fields and concluded

that the XRF method is provides rapid and accurate results.

Mashaly et al. [8] characterized the granite sludge and cement

on the basis of X-ray fluorescence and studied the feasibility of

granite sludge in cement replacement. Elemental composition

of solid residues of sewerage sludge and biomass waste were

examined using XRF [9]. Zhang et al. [10] evaluated the textile

dyeing sludge and cattle manure using XRF and their findings

provided an insight for better reutilization of waste.

Synchrotron-based XRF can be used to know both quantitative

and qualitative multi-elemental concentration in very less time



Atomic absorption spectroscopy (AAS)

Inductively coupled plasma-atomic emission spectrometry

(

ICP-AES) or inductively coupled plasma-mass

spectrometry (ICP-MS) or Inductively coupled plasma-

optical emission spectrometry (ICP-OES).

Energy-dispersive X-ray Fluorescence Spectrometry (ED-

XRF) or Wavelength dispersive XRF (WD-XRF)

Neutron activation analysis (NAA)



Particle-induced X-ray emission (PIXE)

For the last 20 years, the energy dispersive X-ray fluorescence

EDXRF) has advanced diligently. The developments made in

(

[11] and it is a non-destructive, most precise and accurate

semiconductors, digital signal processing and data simulation

have broadened the usability of the XRF method for

economical, small-size spectrometers for trace elemental

analysis in various types of samples [1-3]. X-ray fluorescence

being a non-destructive analytical method has its own

merits. XRF analysis provides the composition of a sample by

quantifying the characteristic X-rays evolved from a sample,

excited by radiations (Fig. 1). In X-ray fluorescence, individual

atoms are excited by incident photons, which in turn emit

secondary photons called as characteristic X-rays (Fig. 1a). In

XRF spectroscopy, emission of characteristic X-rays of the

method of trace element determination of all types of samples.

Furthermore, it can simultaneously determine many elements

present in a single sample [12]. In India, this facility is available

at Raja Ramanna Centre for Advanced Technology (RRCAT),

Indore. Presently this technique is being used for the trace

elemental analysis of sludge samples collected from the paper

and toothpaste industry, which is abundant in the study area.

*

Corresponding author: Ajay Sharma, Chitkara University School of Engineering and Technology, Chitkara University, Himachal

Pradesh-174103, India. E-mail: coe@chitkarauniversity.edu.in

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